Electronic effect

Results: 698



#Item
561Semiconductor device fabrication / Diode / Field-effect transistor / Schottky barrier / Ohmic contact / Schottky diode / Depletion region / Gallium arsenide / Semiconductor device / Chemistry / Electronic engineering / Electronics

Lateral IBIC characterization of a GaAs Schottky diode F.Fizzotti1, A.Lo Giudice2, C.Manfredotti1,2,3, C.Paolini1,2,3, E.Vittone1,2,3, F. Nava4, G.Egeni5, V.Rigato5 1 Experimental Physics Dept. University of Torino, 2 IN

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Source URL: www.dfs.unito.it

Language: English - Date: 2004-02-10 04:12:41
562Government procurement in the European Union / Economy of the European Union / Europe / Law / Government procurement in the United States / Procurement / Direct effect / Internal Market / Electronic signature / European Union law / European Union / European Union directives

2003000127en137[removed]

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Source URL: www.europarl.europa.eu

Language: English - Date: 2007-01-23 05:57:55
563Compact Software / Computing / Electronic engineering / Technology / Field-effect transistor / IBM

Compact Modeling Modeling FET Variation within a chip as a Function of Circuit Design and Layout Choices Josef Watts, Ning Lu, Calvin Bittner, Steven Grundon, Jeffrey Oppold

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Source URL: www.nsti.org

Language: English - Date: 2005-05-23 13:16:04
564Technology / MOSFET / Drain Induced Barrier Lowering / Silicon-germanium / Field-effect transistor / Bipolar junction transistor / IC power supply pin / Threshold voltage / Transistor model / Integrated circuits / Electrical engineering / Electronic engineering

A Unified Process-Based Compact Model for Scaled PD/SOI and Bulk-Si MOSFETs Jerry G. Fossum University of Florida Gainesville, FL[removed]http://www.soi.tec.ufl.edu)

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:18:44
565Physical quantities / Electrodynamics / Digital electronics / Electronic design automation / Inductance / Skin effect / Signal integrity / Speaker wire / RC time constant / Electromagnetism / Physics / Electronics

Modeling and Characterization of High Frequency Effects in ULSI Interconnects Narain Arora and Li Song [removed] May 11, 2005

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Source URL: www.nsti.org

Language: English - Date: 2005-06-01 12:58:18
566MOSFET / BSIM / Threshold voltage / Chenming Hu / Transistor model / Field-effect transistor / Multigate device / Electrical engineering / Electronic engineering / Electromagnetism

Microsoft PowerPoint - WCM_2011_Publish

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Source URL: www.techconnectworld.com

Language: English - Date: 2011-07-25 10:32:56
567Electronic engineering / Electronics / Power MOSFET / MOSFET / Field-effect transistor / Electrical engineering

Advanced Compact Models for MOSFETs Christian Enz, Carlos Galup-Montoro, Gennady Gildenblat, Chenming Hu, Ronald van Langevelde, Mitiko Miura-Mattausch, Rafael Rios, Chih-Tang (Tom) Sah

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Source URL: www.nsti.org

Language: English - Date: 2005-05-23 13:20:11
568Electronic design / MOSFET / Integrated circuits / Threshold voltage / Multigate device / CMOS / Field-effect transistor / Short-channel effect / Power MOSFET / Electrical engineering / Electronic engineering / Electromagnetism

Microsoft PowerPoint - WCM2010 [Compatibility Mode]

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Source URL: www.techconnectworld.com

Language: English - Date: 2010-08-24 11:11:24
569Electronic engineering / High-k dielectric / Threshold voltage / Short-channel effect / Meindl / Symmetric matrix / Electrical engineering / Electromagnetism / MOSFET

Compact, Physics-based Modeling of Nanoscale Limits of Double-Gate MOSFETs Qiang Chen, Lihui Wang, Raghunath Murali and James D. Meindl March 10, 2004

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:37:51
570Integrated circuits / Electronics / Technology / CMOS / Field-effect transistor / Electronic engineering / Electronic design / MOSFET

Microsoft PowerPoint - WCM05_GTCNoiseJamalDeen

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Source URL: www.nsti.org

Language: English - Date: 2005-05-23 13:15:13
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